This command prints NAND information (Total bytes written, Bad block count and Erase failures etc) for the given micron device if its of 2200 model controller\&. For OCP complaint controllers this command print extended SMART health data along with NAND information (if available)
.sp
The <device> parameter is mandatory and may be either the NVMe character device (ex: /dev/nvme0), or a namespace block device (ex: /dev/nvme0n1)\&.
.sp
The \fI\-f\fR option controls the displayed output data format based on the option value\&. If the option value is \fIjson\fR (which is enabled by default), output data is printed in JSON format\&. If option value is \fInormal\fR the output is displayed in non\-JSON format\&.
.sp
This will only work on Micron devices devices of model numbers 54XX and OCP complaint controllers\&. Support for new devices may be added subsequently\&.
.SH"OPTIONS"
.sp
\-f <json|normal> controls the format of displayed output\&.
.SH"EXAMPLES"
.sp
.RS4
.ien\{\
\h'-04'\(bu\h'+03'\c
.\}
.el\{\
.sp-1
.IP\(bu2.3
.\}
Retrieve NAND/extended SMART data and display in json format
.sp
.ifn\{\
.RS4
.\}
.nf
# nvme micron vs\-nand\-stats /dev/nvme0
* Retrieve NAND/extended SMART data and display in non\-json format
+
.fi
.ifn\{\
.RE
.\}
.RE
.sp
# nvme micron vs\-nand\-stats /dev/nvme0 \-f normal